Single Crystal X-ray Structure Determination (SC-XRD)

Single Crystal X-ray Structure Determination (SC-XRD) is the most powerful analytical technique for the identification of crystalline phases and the structural characterization of the chemical components.  From the x-ray scattering from a small single crystal, SC-XRD yields the identity and 3-dimensional position of every atom in the structure.  For chiral compounds, SC-XRD may be used to determine the absolute configuration of the structure. 

Typical applications include determination of the chemical structural conductivity of newly synthesized reaction products or byproducts.  The technique may be applied to a wide range of crystalline substances including minerals, inorganic materials, ceramics, metal alloys, drugs and organic materials. 

XRD Instrumentation: 

Bruker APEX-II Kappa CCD diffractometer

Specifications:

Sample size: 0.1 - 0.4 mm               

Temperature range: -170 to 100 ^oC

Radiation: MoKα, 0.7107 Å               

Resolution: 1.0 – 0.3  Å

Angular Scan Range: 3 – 135 deg

 Bruker Apex-II Single Crystal X-ray Diffractometer