Description

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• JEOL 1400PLUS 120kV (top right) Transmission electron microscope with an IXRF energy dispersive x-ray spectrometer and cryo-fin.  Imaging is with an AMT 8 Mpixel camera.  Specimen holders include a standard “quick change” holder, a beryllium holder for use with the spectrometer, a high tilt (+/- 70 degrees) holder for automated tilt tomography using “SerialEM” software, and a Gatan Model 914 high tilt cryo holder with a 655 pumping station and 900 temperature controller. Acquired with an NSF MRI grant in 2014.

 

• JEOL 6510LV 30kV (bottom right) Scanning electron microscope with an IXRF energy dispersive X-ray spectrometer supporting both secondary electron and backscattered electron imaging.  Nonconductive samples can be imaged using the variable pressure “low vacuum” mode.  A variety of mounts are available to image samples as large as 3x6x2 inches. Acquired with an NSF MRI grant in 2015.

 

Capabilities of Microscope

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• JEOL 1400PLUS Transmission electron microscope: Resolution routinely to 0.8 nm.

 

• JEOL 6510LV 30kV  Scanning electron microscope: Resolution routinely to 10 nm; EDS sensitivity is 1 part per 200 in a 1 pg sample. 

 

Service Fees

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• JEOL 1400PLUS: Fee for external users:  $97.50/hour with full assistance.  Preparation costs are $32.50/hour.

 

• JEOL 6510: Fee for external users:  $65/hour with full assistance.  Preparation costs are $32.50/hour.

 

For more information please contact John Andersland (john.andersland@wku.edu).

SEM Contact

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JEOL1400 Plus Transmission electron microscope

 

JEOL6510 LV Scanning electron microscope