X-ray Powder Diffraction (XRD)

X-ray Powder Diffraction (XRD) is a powerful nondestructive technique for the identification of crystalline phases in powdered solid samples.  The sample is exposed to a monochromatic x-ray beam, and the intensity of the diffracted x-rays are measured as a function of the scattering angle (2Θ).  Each crystalline phase of a material produces a unique “fingerprint” pattern, which can usually be identified by comparison to a database of known powder patterns.  In mixtures, minor components can also be identified down to about 5% of the bulk material.  For samples with very small crystallites, the width of the x-ray scattering lines yields information on the crystallite size. 

Typical applications include phase identification in most solids and thin-film samples, including minerals, inorganic materials, ceramics, metal alloys, and organic materials.  XRD can also be used to determine the percent crystallinity in fibers, polymers, plastics, and glasses. 

XRD Instrumentation: 

          Thermo ARL XRD

Specifications:

          Sample capacity: 0.5 - 2.0 g             Temperature range: ambient to 400 ^oC

          Scan rate: 0.1 to 1 deg/min              Angular Resolution: 0.005 deg

          Radiation: CuKa, 1.542 Å                  Angular Scan Range: 3 – 135 deg

  Thermo ARL X-ray Powder Diffractometer                Typical XRD Scan